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Collaborators 2017-04-16T04:08:52+00:00

Dr. Nagarajan Raghavan

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Assistant Professor

Engineering Product Development Pillar

Singapore University of Technology and Design, Singapore

Naga is currently focusing on application of statistical and physical theories, models and simulation techniques to better quantify the quality, reliability, variability and uncertainty in performance / lifetime of any product / system / service with wide applications ranging from the nano-world of atoms and thin films all the way to the macro world of power grids, manufacturing and transportation systems and even system-of-systems (SoS).

Dr. Michel Bosman

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Scientist II

Materials Processing and Characterization Group

Institute of Materials Research and Engineering

Agency for Science Technology and Research, Singapore

Michel is at A*STAR in Singapore, specializing in TEM-based materials characterization. He pioneered atomic-resolution chemical mapping using electron energy-loss spectroscopy. His work also includes the local chemical analysis of gate dielectrics and TEM-based nano-optics and nano-plasmonics.

Dr. Sean O’ Shea

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Principal Scientist

Materials Processing and Characterization Group

Institute of Materials Research and Engineering

Agency for Science Technology and Research, Singapore

Sean received his BSc and PhD in Physics from Sydney University, Australia. Subsequently he undertook research in various areas of Nanoscale science at Cambridge University, UK from 1989 to 1998 and was a Royal Society University Research Fellow.  Since 1999 he has been at the Institute of Materials Research and Engineering (IMRE), Singapore.  His research interests are in Nanotechnology (chiefly scanning probe microscopy and understanding fundamental surface forces), nano-fluidics and MEMS.

Prof. Hiroshi Iwai

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Professor

Tokyo Institute of Technology, Japan

Among Prof. Hiroshi’s many innovations, he developed technologies for shallow junctions and optical lithography to allow fabrication of 40-nm gate-length CMOS transistors. He also devised techniques for growing ultra-thin silicon oxide films to overcome leakage issues when using extremely small gate lengths.

Prof. Alex Shluger

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Professor

Department of Physics

University College London, United Kingdom

Alex’s main research interests broadly concern the mechanisms of defect processes in the bulk and at surfaces of insulators. Alex has also developed theoretical methods for predictive modelling of point defects, self-trapped excitons and polarons in insulating materials.

Prof. Guido Groeseneken

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IEEE Fellow

Department ESAT

IMEC, Belgium

Dr. Guido has made contributions to the fields of non-volatile semiconductor memory devices and technology, reliability physics of VLSI-technology, hot carrier effects in MOSFET’s, time-dependent dielectric breakdown of oxides, ESD-protection and -testing, plasma processing induced damage, electrical characterization of semiconductors and characterization and reliability of high k dielectrics.He has served as a technical program committee member of several international scientific conferences, among which the IEEE International Electron Device Meeting (IEDM) and the International Reliability Physics Symposium (IRPS). He has authored or co-authored more than 300 publications in international scientific journals and in international conference proceedings, 3 book chapters and 11 patents in his fields of expertise.

Dr. Shubhakar Kalya

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Lecturer

Engineering Product Development Pillar

Singapore University of Technology and Design, Singapore

Shubhakar’s research is related to characterization of High-κ gate dielectrics using scanning tunneling microscopy and atomic force microscopy.  His research interests are in nanoscale characterization and analysis of High-κ gate dielectrics for logic and memory devices, and failure analysis of nanoscale electronic devices.

Dr. Luca Larcher

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Associate Professor

Dipartimento di Scienze e Metodi dell’Ingegneria

Università di Modena e Reggio Emilia, Italy

Luca leads in developing physical models reproducing the physical mechanisms governing the operation and reliability of various NVM devices (standard FG Flash, NROM, TANOS, PCM, RRAM). He is also working on the modeling of charge transport and degradation in high-k stacks for both logic and non-volatile memory applications.

Dr. Andrea Padovani

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Assistant Professor

Dipartimento di Scienze e Metodi dell’Ingegneria

Università di Modena e Reggio Emilia, Italy

Andrea’s research activity focuses on the electrical characterization, physical modeling and reliability of solid-state non-volatile memory (NVM) devices and logic transistors. In the framework of NVMs, he currently works on the investigation and modeling of the physical mechanisms governing the operation and degradation of resistive memory devices (RRAM) based on transition metals oxides.

Prof. Tuo Hung Hou (Alex)

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Professor

Department of Electronics Engineering

National Chiao Tung University, Taiwan

Prof. Alex’s current research emphasizes on the combined experimental and modeling approach on emerging post-CMOS solid-state devices nonvolatile-charge based floating-gate structures, resistive switching of binary oxides, Solid-state molecular sensor through measuring the characteristic reduction and oxidation states of individual molecules. Prof. Alex has authored or co-authored more than 80 technical papers and held 8 U.S. patents. He was also a recipient of IEEE Electron Device Society PhD student fellowship in 2007.

Dr Jean CHAZELAS

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Scientific Director

Defence Mission Systems (DMS) Division

Thales

Dr Jean CHAZELAS is the Scientific Director in Thales DMS (Defence Mission Systems) Division. He has been involved in numerous European and International projects and contracts in the field of Microwaves, Photonics and Nanotechnologies. His research interests also spans across structural characterization and physics of semiconductor and superconductor devices including advanced optoelectronic devices. He holds more than 200 publications and 40 patents in the field of Semiconductor physics, Spintronics, Photonics, Microwaves and related Nanotechnologies.

Prof. Hei Wong

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Professor

Department of Electronic Engineering

City University of Hong Kong

Dr. Hei Wong has served as a member of the Editorial Advisory Board for the Microelectronics Reliability journal since 1996 and has served as a Regional Editor for the Microelectronics Reliability journal since 1999. He was the Regional Editor for IEEE EDS Newsletter during 2002-2008. He has served as a distinguished lecturer for IEEE EDS since 2002. He also served as a gust editor for International Journal of High-Speed Electronics and Systems for the special issue of Frontiers in Electronics: From Materials to System in 2005. 

Prof. Dong Shurong

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Professor

Department of Information Science and Electronic Engineering

Zhejiang University

Dr. Shurong’s expertise is in  ESD (Electrostatic Discharge) modeling, design and measurement. Additionally, he has made significant contributions on the modeling, fabrication and application of RF MEMS devices and its sensors.

Prof. Mario Lanza

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Associate Professor

Institute of Functional Nano and Soft Materials

Soochow University

Dr. Mario is a Young 1000 Talent professor at the Institute of Functional Nano & Soft Materials of Soochow University. His research interests focus on the nanoscale characterization of emerging electronic devices using 2D materials.

Prof. Wu Xing

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Professor

Department of Electrical Engineering

East China Normal University, Sanghai

Dr. Wu Xing’s research interest is in in-situ TEM characterization of advanced nano-devices, synthesis of two-dimensional nano-materials and device integration for flexible electronics applications.

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