RESEARCH FOCUS

  • RELIABILITY PHYSICS OF NANOELECTRONIC DEVICES.
    • Statistical modeling, simulation and characterization of failure mechanisms, random telegraph noise and performance variability in silicon and non-silicon based nanodevices including NVM (RRAM, STT-RAM), PV, power electronics and 2D material based devices (Graphene, CNT).
  • PROGNOSTICS AND SYSTEM HEALTH MANAGEMENT (PHM).
    • Remaining useful life (RUL) estimation of engineering products and systems with real-time sensor acquired degradation data for non-ideal scenarios of variable loading, multiple failure mechanisms, non-linear degradation trends, non-Gaussian perturbations etc…
    • Techniques used for predictive analytics in this context include Bayesian inference, filtering methods, regression analysis and machine learning approaches as well.
  • RELIABILITY-BASED DESIGN & UNCERTAINTY QUANTIFICATION.
    • Use of simulation tools and modeling approaches to quantify uncertainty in different fabrication processes and ensuring reliability is incorporated at the design phase using FORM, SORM and robust design tools and techniques. Application of these techniques is currently focused on additive manufacturing (3D printing) to ensure there is adequate quality control in the fabrication process.